Title:Test Generation for Acyclic Sequential Circuits using Combinational ATPG for Single Stuck-at Faults
Authors: Hideyuki Ichihara, Tomoo Inoue, Akio Tamura
Jounrnals:Technical Report of IEICE
Volume: 100
Number: 473
Pages: 203-208
Published Month: 11
Published Year: 2000
Type: techreport
Abstract:
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