Title:Test Generation for Acyclic Sequential Circuits using Combinational ATPG for Single Stuck-at Faults

Authors: Hideyuki Ichihara, Tomoo Inoue, Akio Tamura

Jounrnals:Technical Report of IEICE

Volume: 100

Number: 473

Pages: 203-208

Published Month: 11

Published Year: 2000

Type: techreport

Abstract:
NULL