Title：Optimal granularity of test generation in a distributed system
Authors: Hideo Fujiwara, Tomoo Inoue
Jounrnals：IEEE Trans. on Computer-Aided Design
Number: 8
Pages: 885-892
Published Month: 8
Published Year: 1990
Type: article
Abstract:
NULL
Title：Optimal granularity of test generation in a distributed system
Authors: Hideo Fujiwara, Tomoo Inoue
Jounrnals：IEEE Trans. on Computer-Aided Design
Number: 8
Pages: 885-892
Published Month: 8
Published Year: 1990
Type: article
Abstract:
NULL
