Title：Testing for the programming circuit of SRAM-based FPGAs
Authors: Hiroyuki Michinishi, Tokumi Yokohira, T. Okamoto, Tomoo Inoue, Hideo Fujiwara
Jounrnals：IEICE Trans. Inf. & Syst.
Volume: E82-D
Number: 6
Pages: 1051-1057
Published Month: 6
Published Year: 1999
Type: article
Abstract:
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