Title：Optimal granularity of test generation in a distributed system
Authors: Hideo Fujiwara, Tomoo Inoue
Jounrnals：Proc. IEEE Int. Conf. on Computer-Aided Design
Pages: 158-161
Published Year: 1989
Type: inproceedings
Abstract:
NULL
Title：Optimal granularity of test generation in a distributed system
Authors: Hideo Fujiwara, Tomoo Inoue
Jounrnals：Proc. IEEE Int. Conf. on Computer-Aided Design
Pages: 158-161
Published Year: 1989
Type: inproceedings
Abstract:
NULL
