Title：Universal test complexity of field-programmable gate arrays
Authors: Tomoo Inoue, Hideo Fujiwara, Hiroyuki Michinishi, Tokumi Yokohira, T. Okamoto
Jounrnals：Proc. fourth IEEE Asian Test Symposium
Pages: 259-265
Published Month: 11
Published Year: 1995
Type: inproceedings
Abstract:
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