Title:A test methodology for interconnect structures of LUT-based FPGAs
Authors: Hiroyuki Michinishi, Tokumi Yokohira, T. Okamoto, Tomoo Inoue, Hideo Fujiwara
Jounrnals:Proc. Fifth IEEE Asian Test symposium
Pages: 68-74
Published Month: 11
Published Year: 1996
Type: inproceedings
Abstract:
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