Title:A test methodology for interconnect structures of LUT-based FPGAs

Authors: Hiroyuki Michinishi, Tokumi Yokohira, T. Okamoto, Tomoo Inoue, Hideo Fujiwara

Jounrnals:Proc. Fifth IEEE Asian Test symposium

Pages: 68-74

Published Month: 11

Published Year: 1996

Type: inproceedings

Abstract:
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