Title：Testing for the programming circuit of LUT-based FPGAs
Authors: Hiroyuki Michinishi, Tokumi Yokohira, T. Okamoto, Tomoo Inoue, Hideo Fujiwara
Jounrnals：Proc. Sixth IEEE Asian Test Symp.
Pages: 242-247
Published Month: 11
Published Year: 1997
Type: inproceedings
Abstract:
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