Title：Sequential test generation based on circuit pseudo-transformation
Authors: Shinnosuke Oharu, Tomoo Inoue, Hideo Fujiwara
Jounrnals：Proc. Sixth IEEE Asian Test Symp.
Published Month: 11
Published Year: 1997
Type: inproceedings
Abstract:
NULL
Title：Sequential test generation based on circuit pseudo-transformation
Authors: Shinnosuke Oharu, Tomoo Inoue, Hideo Fujiwara
Jounrnals：Proc. Sixth IEEE Asian Test Symp.
Published Month: 11
Published Year: 1997
Type: inproceedings
Abstract:
NULL
