Title：Test generation for acyclic sequential circuits with hold registers
Authors: Tomoo Inoue, D. K. Das, Chiiho Sano, Takahiro Mihara, Hideo Fujiwara
Jounrnals：Proc. International Conf. on Computer Aided Design
Pages: 550-556
Published Month: 11
Published Year: 2000
Type: inproceedings
Abstract:
NULL
