Title：A test generation method for acyclic sequential circuits with L/H-type registers
Authors: Takahiro Mihara, Tomoo Inoue, Hideo Fujiwara
Jounrnals：Technical Report of IEICE
Number: (FTS97-75)
Pages: 33-40
Published Month: 2
Published Year: 1998
Type: techreport
Abstract:
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