Title：On the acceleration of test application time for microcontrollers using embedded processors
Authors: Y. Otsubo, Tomoo Inoue, Y. Fukui, Hideo Fujiwara
Jounrnals：Technical Report of IPSJ
Number: (DA91-4)
Pages: 25-32
Published Month: 2
Published Year: 1999
Type: techreport
Abstract:
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