Title：Test response compression using Huffman coding
Authors: Michihiro Shintani, Toshimasa Ohara, Hideyuki Ichihara, Tomoo Inoue, Akio Tamura
Jounrnals：Technical Report of IEICE
Volume: VLD2002-88
Pages: 35-40
Published Month: 11
Published Year: 2002
Type: techreport
Abstract:
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