Title:A Method of Test Generation for Acyclic Sequential Circuits Using Single Stuck-at Fault Combinational ATPG

Authors: Hideyuki Ichihara, Tomoo Inoue

Jounrnals:IEICE Trans. Fundamentals

Volume: E86-A

Number: 12

Pages: 3072-3078

Published Month: 12

Published Year: 2003

Type: article

Abstract:
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