Title:A Method of Test Generation for Acyclic Sequential Circuits Using Single Stuck-at Fault Combinational ATPG
Authors: Hideyuki Ichihara, Tomoo Inoue
Jounrnals:IEICE Trans. Fundamentals
Volume: E86-A
Number: 12
Pages: 3072-3078
Published Month: 12
Published Year: 2003
Type: article
Abstract:
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