Title：A Test Compression for Test Application Based on Huffman Coding
Authors: Toshimasa Ohara, Michihiro Shintani, Hideyuki Ichihara, Tomoo Inoue, Akio Tamura
Jounrnals：Technical Report of IEICE
Volume: 102
Number: 658
Pages: 67-72
Published Month: 2
Published Year: 2003
Type: techreport
Abstract:
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