Title：Channel Width Test Data Compression under a Limited Number of Test Inputs and Outputs
Authors: Hideyuki Ichihara, Kozo Kinoshita, Kohji Isodono, Shigeki Nishikawa
Jounrnals：Proc. the 16th International Conference on VLSI Design
Pages: 329-334
Published Month: 1
Published Year: 2003
Type: inproceedings
