Title:An Improvement of the Test Plan Generation Algorithm for Strongly Testable Datapaths
Authors: Naoki Okamoto, Hideyuki Ichihara, Tomoo Inoue, Toshinori Hosokawa, Hideo Fujiwara
Jounrnals:Technical Report of IEICE
Volume: 103
Number: 476
Pages: 13-18
Published Month: 11
Published Year: 2003
Type: techreport
Abstract:
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