Title:An Improvement of the Test Plan Generation Algorithm for Strongly Testable Datapaths

Authors: Naoki Okamoto, Hideyuki Ichihara, Tomoo Inoue, Toshinori Hosokawa, Hideo Fujiwara

Jounrnals:Technical Report of IEICE

Volume: 103

Number: 476

Pages: 13-18

Published Month: 11

Published Year: 2003

Type: techreport

Abstract:
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