Title：A Test Decompression Scheme for Variable-Length Coding
Authors: Hideyuki Ichihara, Masakuni Ochi, Michihiro Shintani, Tomoo Inoue
Jounrnals：IEEE Proc. Asian Test Symp.
Pages: 426-431
Published Month: 11
Published Year: 2004
Type: inproceedings
Abstract:
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