Title：An Improvement of a Test Plan Generation Algorithm for Hierarchical Test Based on Strong Testability
Authors: Tomoo Inoue, Naoki Okamoto, Hideyuki Ichihara, Toshinori Hosokawa, Hideo Fujiwara
Jounrnals：Workshop on RTL and High Level Testing
Pages: 37-42
Published Month: 11
Published Year: 2003
Type: inproceedings
Abstract:
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