Title：A Test Compression Algorithm for Reducing Test Application Time
Authors: Michihiro Shintani, Toshimasa Ohara, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：5th Workshop on RTL and High Level Testing
Pages: 53-58
Published Month: 11
Published Year: 2004
Type: inproceedings
Abstract:
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