Title：Max-Testable Class of Sequential Circuits having Combinational Test Generation Complexity
Authors: D. K. Das, Tomoo Inoue, S. Chakraborty, Hideo Fujiwara
Jounrnals：IEEE Proc. Asian Test Symp.
Pages: 342-347
Published Month: 11
Published Year: 2004
Type: inproceedings
Abstract:
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