Title：Test generation and design-for-testability based on acyclic structure with hold registers
Authors: Tomoo Inoue, D. K. Das, Chiiho Sano, Takahiro Mihara, Hideo Fujiwara
Jounrnals：1st Workshop on RTL ATPG and DFT
Published Month: 9
Published Year: 2000
Type: inproceedings
Abstract:
NULL
