Title：A partial scan design with orthogonal scan paths
Authors: Tomoo Inoue, Hideo Fujiwara
Jounrnals：3rd Workshop on RTL and High Level Testing
Published Month: 11
Published Year: 2002
Type: inproceedings
Abstract:
NULL
Title：A partial scan design with orthogonal scan paths
Authors: Tomoo Inoue, Hideo Fujiwara
Jounrnals：3rd Workshop on RTL and High Level Testing
Published Month: 11
Published Year: 2002
Type: inproceedings
Abstract:
NULL
