Title:A Reconfigurable Embedded Decompressor for LSI Testing

Authors: Tomoyuki Saiki, Hideyuki Ichihara, Tomoo Inoue


Volume: 105

Number: 42

Pages: 1-6

Published Month: 5

Published Year: 2005

Type: techreport

The problem of the increase in test data size for large-scale curcuits has developed. In order to solve this problem, several techniques of decompressing test data compressed using decompressors embedded in an LSI under test have been proposed. In this paper, we propose a model of embedded decompressors that are reconfigurable according to test data, and show example of the decompressor architecture for three coding techniques. Furthermore, the test data compression ratio in the test of SoC cores and the program data size required for reconfiguration are evaluated by our experiments.