タイトル：A Reconfigurable Embedded Decompressor for Test Compression
著者: Tomoyuki Saiki, Hideyuki Ichihara, Tomoo Inoue
雑誌名：Proc. IEEE International Workshop on Electronic Design, Test & Applications (DELTA2006)
アブストラクト: Test compression/decompression methods for reducing the test application time and the memory requirement of an LSI tester have been proposed. In these methods, the employed coding algorithms are tailored to a given test set, so that the tailored coding algorithm can compress highly the test set. However, these methods have some drawbacks, e.g., the coding algorithm may be not effective in test sets except for the given test set. In this paper, we introduce a model of embedded decompressor that are reconfigurable according to the used coding algorithms and a given test set. Its reconfigurability can overcome the drawbacks of conventional decompressors with keeping high compression ratio. Moreover, we propose an architecture of reconfigurable decompressor for four variable-length codings are implemented as fixed (or non-reconfigurable) components so as to reduce the configuration data, which is stored on an ATE and sent to a CUT. Experimental results show that (1) the configuration data size becomes reasonably small by reducing the configuration part of the decompressor, (2) the reconfigurable decompressor is effective for SoC testing in respect of the test data size, and (3) it can achieve an optimal compression of test sets by Huffman coding.