Title：TAM Design and Optimization for Transparency-based SoC Test
Authors: Tomokazu Yoneda, Akiko Shuto, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara
Jounrnals：Proc. VLSI Test Symp.
Pages: 381-386
Published Month: 5
Published Year: 2007
Type: inproceedings
