Title：An Optimal Test Bus Design for Transparency-based SoC Test
Authors: Tomokazu Yoneda, Akiko Shuto, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara
Jounrnals：Workshop on RTL and High Level Testing
Pages: 21-26
Published Month: 11
Published Year: 2006
Type: inproceedings
