Title:A Self-Test of Dynamically Reconfigurable Processors

Authors: Takashi Fujii, Hideyuki Ichihara, Tomoo Inoue

Jounrnals:IEICE Tech. Repo. (DC2006-49)

Volume: 106

Number: 390

Pages: 65-70

Published Month: 11

Published Year: 2006

Type: techreport

Dynamically Reconfigurable Processor (DRP), which can execute a task with multiple hardware contexts so as to achieve high area-efficiency, needs a new test methodology because of its distinctive architecture. In this paper, we propose a a self-test method of DRPs without area overhead. This method constructs a test flame of processor elements (PEs) such that it consists of test pattern generators, response analyzers and PEs under test, and switches several test flames dynamically so as to test all the PEs. Since the structure of a test flame decides the number of contexts and test application time, we design some test flames with different structures and discuss the relationship of the structures to the number of contexts and test application time. Based on this discussion, we can construct the best test flame according to a given test environment.