Title：An Entended Class of Sequential Circuits with Acyclical Testability
Authors: Nobuya Oka, Chia Yee Ooi, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara
Jounrnals：IEICE Tech. Repo. (DC2006-88)
Volume: 106
Number: 528
Pages: pp.49-54
Published Month: 2
Published Year: 2007
Type: techreport
