Title：On the Fault Escape and Yield Loss by Faulty BIST Circuits
Authors: Masashi Yamanaka, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：Proc. of the 2006 IEICE General Conference
Published Month: 3
Published Year: 2006
Type: techreport
Reference: http://harp.lib.hiroshima-u.ac.jp/handle/harp/4748
