Title：An Extended Class of Acyclically Testable Circuits
Authors: Nobuya Oka, Chia Yee Ooi, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara
Jounrnals：Dig. of Papers of 8th Workshop on RTL and High-Level Testing (WRTLT'07)
Published Month: 10
Published Year: 2007
Type: inproceedings
