Title：A Self-Test of Dynamically Reconfigurable Processors with Test Frames
Authors: Tomoo Inoue, Takashi Fujii, Hideyuki Ichihara
Jounrnals：IEICE Trans. Inf. & Syst.
Volume: E91
Number: 3
Pages: 756-762
Published Month: 3
Published Year: 2008
Type: article
Reference: http://harp.lib.hiroshima-u.ac.jp/handle/harp/6025
