タイトル：Fast False Path Identification Based on Functional Unsensitizability Using RTL Information
著者: Yuki Yoshikawa, Satoshi Ohtake, Tomoo Inoue, Hideo Fujiwara
雑誌名：Proc. the 14th Asia and South Pacific Design Automation Conference (ASP-DAC)
ページ: 660-665
発行月: 1
発行年: 2009
タイプ: inproceedings
