Title：A Test Generation Model for Threshold Testing
Authors: Kenta Sutoh, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：IEICE Tech. Rep.
Volume: 108
Number: 352
Pages: 5-10
Published Month: 12
Published Year: 2008
Type: techreport
Title：A Test Generation Model for Threshold Testing
Authors: Kenta Sutoh, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：IEICE Tech. Rep.
Volume: 108
Number: 352
Pages: 5-10
Published Month: 12
Published Year: 2008
Type: techreport
