Title：Test Generation and DFT Based on Partial Thru Testability
Authors: Nobuya Oka, Chia Yee Ooi, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara
Jounrnals：Proc. European Test Symposium (CD-ROM)
Published Month: 5
Published Year: 2009
Type: inproceedings
