Title：A high-level approach to test design
Authors: Tomoo Inoue
Jounrnals：Session 7: Testing, SEMI Technology Symposium 2008
Published Month: 12
Published Year: 2008
Type: survey
Title：A high-level approach to test design
Authors: Tomoo Inoue
Jounrnals：Session 7: Testing, SEMI Technology Symposium 2008
Published Month: 12
Published Year: 2008
Type: survey
