Title：On the Acceleration of Threshold Test Generation Based on Fault Acceptability
Authors: Yusuke Nakashima, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：IEICE Technical Report
Volume: 108
Number: 431
Pages: 1-6
Published Month: 2
Published Year: 2009
Type: techreport
Reference: http://ci.nii.ac.jp/naid/110007131397
