Title：A Practical Approach to Threshold Test Generation for Error Tolerant Circuits
Authors: Hideyuki Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue
Jounrnals：IEEE Proc. ATS
Published Month: 11
Published Year: 2009
Type: inproceedings
Title：A Practical Approach to Threshold Test Generation for Error Tolerant Circuits
Authors: Hideyuki Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue
Jounrnals：IEEE Proc. ATS
Published Month: 11
Published Year: 2009
Type: inproceedings
