Title：Test Generation for Sequential Circuits with Partial Thru Testability
Authors: Nobuya Oka, Chia Yee Ooi, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara
Jounrnals：IEICE Trans. Inf. & Syst.
Volume: J92-D
Number: 12
Published Month: 12
Published Year: 2009
Type: article
Reference: http://harp.lib.hiroshima-u.ac.jp/handle/harp/6411
