Title：A Fast Threshold Test Generation Algorithm Based on 5-Valued Logic
Authors: Tomoo Inoue, Nobukazu Izumi, Yuki Yoshikawa, Hideyuki Ichihara
Jounrnals：IEEE Proc. DELTA
Pages: 345-349
Published Month: 1
Published Year: 2010
Type: inproceedings
Title：A Fast Threshold Test Generation Algorithm Based on 5-Valued Logic
Authors: Tomoo Inoue, Nobukazu Izumi, Yuki Yoshikawa, Hideyuki Ichihara
Jounrnals：IEEE Proc. DELTA
Pages: 345-349
Published Month: 1
Published Year: 2010
Type: inproceedings
