Title：A Design of Concurrently Testable Response Analyzers in Built-in Self-Test
Authors: Yuki Fukazawa, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：IEEE Digest Papers of WRTLT
Pages: 88-93
Published Month: 11
Published Year: 2009
Type: inproceedings
