Title：A Yield Model of Design for Testability and Repairability
Authors: Hideyuki Ichihara, Yujiro Amano, Yuki Yoshikawa, Tomoo Inoue
Jounrnals：IEEE Proc. RASDAT
Pages: 23-28
Published Month: 1
Published Year: 2010
Type: inproceedings
Title：A Yield Model of Design for Testability and Repairability
Authors: Hideyuki Ichihara, Yujiro Amano, Yuki Yoshikawa, Tomoo Inoue
Jounrnals：IEEE Proc. RASDAT
Pages: 23-28
Published Month: 1
Published Year: 2010
Type: inproceedings
