Title：A Yield Model with Testability and Repairabilit
Authors: Yujiro Amano, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：IEICE Technical Report
Volume: 109
Number: DC-316
Pages: 89-94
Published Month: 12
Published Year: 2009
Type: techreport
Reference: http://www.ieice.org/ken/paper/200912038aRg/
