Title：Design and Optimization of Transparency-Based TAM for SoC Test
Authors: Tomokazu Yoneda, Akiko Shuto, Hideyuki Ichihara, Tomoo Inoue, Hideo Fujiwara
Jounrnals：IEICE Trans. Inf. & Syst.
Volume: E93-D
Number: 6
Pages: 1549-1559
Published Month: 6
Published Year: 2010
Type: article
