Title：A Test Generation Algorithm Based on 5-valued Logic for Threshold Testing
Authors: Nobukazu Izumi, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue
Jounrnals：IEICE Technical Report
Volume: 109
Number: 95
Pages: 13-18
Published Month: 6
Published Year: 2009
Type: techreport
Reference: http://www.ieice.org/ken/paper/20090619faND/
