Title：A Practical Threshold Test Generation for Error Tolerant Application
Authors: Hideyuki Ichihara, Kenta Sutoh, Yuki Yoshikawa, Tomoo Inoue
Jounrnals：IEICE Trans. Inf. & Syst.
Volume: E93-D
Number: 10
Pages: 2776-2782
Published Month: 10
Published Year: 2010
Type: article
Reference: http://search.ieice.org/bin/summary.php?id=e93-d_10_2776&category=D&year=2010&lang=E&abst=
