タイトル：A New Class of Acyclically Testable Sequential Circuits with Multiplexers
著者: Nobuya Oka, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue
雑誌名：Workshop on RTL and High Level Testing
発行月: 12
発行年: 2010
タイプ: inproceedings
タイトル：A New Class of Acyclically Testable Sequential Circuits with Multiplexers
著者: Nobuya Oka, Yuki Yoshikawa, Hideyuki Ichihara, Tomoo Inoue
雑誌名：Workshop on RTL and High Level Testing
発行月: 12
発行年: 2010
タイプ: inproceedings
