Title：Flexible test scheduling for an asynchronous on-chip interconnect through special data transfer
Authors: Tsuyoshi Iwagaki, Eiri Takeda, Mineo Kaneko
Jounrnals：IEICE Trans. on Fundamentals
Volume: E94-A
Number: 12
Pages: 2563-2570
Published Month: 12
Published Year: 2011
Type: article
