Title：A low power deterministic test using scan chain disable technique
Authors: Zhiqiang You, Tsuyoshi Iwagaki, Michiko Inoue, Hideo Fujiwara
Jounrnals：IEICE Trans. Inf. & Syst.
Volume: E89-D
Number: 6
Pages: 1931-1939
Published Month: 6
Published Year: 2006
Type: article
