Title：A test generation method for delay faults in sequential circuits with discontinuous reconvergence structure
Authors: Tsuyoshi Iwagaki, Satoshi Ohtake, Hideo Fujiwara
Jounrnals：Trans. of IEICE (DI)
Volume: J86-D-I
Number: 12
Pages: 872-883
Published Month: 12
Published Year: 2003
Type: article
