Title：Power-constrained test generation for hold-time faults using integer linear programming
Authors: Tsuyoshi Iwagaki, Kewal K. Saluja
Jounrnals：Proc. 4th IEEE International Workshop on Impact of Low-Power Design on Test and Reliability (LPonTR '11)
Pages: 1-2
Published Month: 5
Published Year: 2011
Type: inproceedings
